Sviridov, Mikhail Vladimirovich

Report

• Sviridov M.V.^*, Mosin A.P.^*, Antonov Y.E.^*, Nikitenko M.N.^*, Martakov S.V.^*, Maurer H.M.^*
  Application of resolution analysis algorithm for accuracy evaluation of inversion results from LWD resistivity data
  ^*Baker Hughes (Novosibirsk), Russia