Lenshin A.S. Kashkarov V.M. Anisimov A. Domashevskaya E.P. Beltyukov A.N. Gilmutdinov F.Z.
Investigation of theporous silicon surface composition by X-ray photoelectron and ultrasoft x-ray emission spectroscopy.
Reporter: Lenshin A.S.
Abstracts file: | lenshin var por-Si.doc |
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