Gilmutdinov, Faat Zalalutdinovich

Report

• Lenshin A.S.^*, Kashkarov V.M.^**, Anisimov A.^*, Domashevskaya E.P.^**, Beltyukov A.N.^***, Gilmutdinov F.Z.^***
  Investigation of theporous silicon surface composition by X-ray photoelectron and ultrasoft x-ray emission spectroscopy.
  ^*ГОУ ВПО "Воронежский Государственный Университет" (Voronezh), Russia
  ^**Воронежский государственный университет (Voronezh), Russia
  ^***Физико-технический институт УрО РАН (Izhevsk), Russia